Teradyneitd.com
Title
Teradyne - Semiconductor Test - J750 Test System Home Page
Description
Excerpted from the website description:
- Teradyne redefines the economics of test by packing power and performance into the compact, economical J750 Family of semiconductor test systems. The J750 delivers up to 1,024 digital channels in a zero footprint system entirely contained within a test head.
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English
Additional Information
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Categories:
- ASICs
- ATE
- Automated Test Equipment
- Digital Audio
- Embedded Memory Tester
- FPGAs
- Fabless
- HPL Tools
- Handler
- High Parallel Test
- IG-XL
- ITD
- J750
- Logic Device Testing
- Low Cost Test Solutions
- Low Cost Tester
- MCU
- Mechanical Solutions
- Microcontroller Test
- Mixed Signal Test
- PLDs
- RA
- RFID
- Redundancy Analysis
- Scan Testing
- Semiconductor
- Semiconductor Device Testing
- Semiconductor Test
- Smart Card
- Structural Test
- Subcontractor
- Test Cell Solutions
- Test Equipment
- Test System
- VLSI Semiconductor Test
- Video Devices