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pulled from site's meta descriptionINTEGRATED METROLOGY FOR WAFER DEFECT INSPECTION
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Categories:
- AboutUs AutoGen
- wafer defect inspection
- integrated metrology
- unpatterned wafer
- defect map
- tff files
- particle analysis
- aerosol
- consulting
- micromark 5000
- wafer marker
- masterscan
- mm5000
- micromark
- patents for sale
- high technology startup
- investors wanted
- semiconductor manufacturing equipment
- semiconductor
- particle technology
- defect inspection
- microanalysis
- SEM/EDX
- SEM
- EDX
- yield