Angstrom Sun Technologies Inc - Find the Best Optical Solutions
Description
pulled from site's meta descriptionLooking for film thickness mapping reflectometer? Find the Best Optical Solutions at Angstrom Sun Technologies who provides a series of low cost optical & high performance tools for characterizing thick coating thickness, thin film thickness, and much more. Call at +1 (978) 263-6678 for more details.
This is an automatically generated AboutUs page for angstec.com. Click the "Edit" button at the top of the page to make changes. Please read our Getting Started page if you need any help.
[[Category:analysis serviceOptical Database]][[Category:Reflectance Transmittance]]
Categories:
- AboutUs AutoGen
- Microspectrophotometer
- Reflectometer
- Reflectometers
- Spectro-reflectometer
- Microreflectometer
- Spectrometer
- Spectrophotometer
- Micropsectrometer
- Ellipsometer
- Analytical Service
- Database of Optical Constants
- Ellipsometry Database
- Thin Film Thickness Measurement System
- Imaging Software
- Digital Eyepiece
- Camera
- TFProbe
- Angstrom
- Ellipsometry
- Spectroscopic
- Spectroscope
- Spectroscopy
- Reflectometry
- Interferometry
- Spectrometry
- Spectrophotometry
- Photometry
- Reflection
- Transmission
- Absorption
- Absorbance
- Thin film
- Coatings
- Thin-film
- Thin-films
- Thick coating
- Films
- film thickness
- thickness gauge
- coating thickness
- thickness mapping system
- Uniformity
- Thickness Measurement
- Spectrareflectance
- Refractive Index
- index of refraction
- Extinction Coefficient
- Optical Constants
- Dielectric Constants
- Semiconductor
- ploymer
- polyimide
- Metals
- Oxide
- Oxides
- Nitride
- Nitrides
- Silicon Nitride
- Silicon Dioxide
- Titanium
- Angstec