NanoPhotonIcs.de
Title
NanoPhotonics - Defect and Thin Film Measurement Equipment for Semiconductor Applications |
Description
NanoPhotonics provides thin film measurement and defect measurement equipment for the semiconductor industry - ellipsometer, particle counter, reflectometer, thin film measurement systems for semiconductor applications
Languages
English
Address
- Galileo Galilei Str. 28
- D-55129 Mainz GERMANY
Contact
- Nanophotonics AG
-
- +49 89 282862, Fax: +49 89 282896
Additional Information
Related Domains
External Links
- Alexa: NanoPhotonIcs.de
Categories:
- Absorption
- Area Defect
- Automatic Metrology Equipment
- Business
- Compound Semiconductors
- Dark Field
- Defect Inspection
- Defect Measurement
- Defects
- Defects On Silicon Wafers
- Defects On Wafers
- Electronics And Electrical
- Ellipsometer
- Ellipsometry
- Equipment
- Film Thickness
- Film Uniformity
- Films
- Flat Panels
- Glass Mask Blank Inspection
- Hard Disks
- Haze
- In Line Metrology
- In Situ Metrology
- Instrumentation
- Integrated Circuits
- Integrated Measurement
- Integrated Metrology
- Integrated Technologies
- Layers
- Mems
- Materials Research
- Measurement
- Measurement Technology
- Metrology
- Metrology Company
- Micrometers
- Microsystems
- Nano Photonics
- Optical Properties
- Particle Counter
- Particles
- Particles On Silicon Wafers
- Refractive Index
- Scratch
- Semiconductor Test Equipment
- Sensors
- Small Ellipsometer
- Spectrometers
- Stand Alone Metrology
- Thin
- Thin Film Measurement
- Thin Film Technology
- Thin Films
- Wafers
- Defectinspection
- Electronics and Electrical
- For
- In-line Metrology
- In-situ Metrology
- MEMS
- Test