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Description
pulled from site's meta descriptionJordan Valley Semiconductors (JVS) develops, serves, manufactures and sells X-ray and VUV metrology solutions (XRF, XRR, XRD, WAXRD,HRXRD,SAXS & VUV) to semiconductors manufacturers, such as logic (IDM and foundries)and memory (DRAM, Flash) fabs as well as hard disk drives, HBLED fabs and other compound semiconductors and related fields. Our metrology tools cover front end of the line (FEOL - SiGe, HiK, Metal gate), back end of the line (BEOL - Copper Seed Barrier, Tungsten and Aluminum) wafer level packaging (UBM and Micro bumps) and many others.
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Categories:
- AboutUs AutoGen
- X-ray
- Metrology
- X-ray metrology
- Spectrometry
- Semiconductor
- silicon
- Compound semiconductors
- XRR
- XRF
- XRD
- SAXS
- HRXRD
- WAXRD
- XCD
- X-ray Diffraction
- X-ray Microanalysis
- Small spot XRF
- JVX7200
- JVX7300
- JVX6200
- JVX6200i
- JVX5200
- BedeMetrix
- BedeScan
- Bede D1
- QC3
- QC-RT
- QC-TT
- Delta-X
- QC200
- QC1A
- Barrier and Seed Layers
- Interconnect Metals
- Process Control
- Etch
- Copper
- Strain Metrology
- SiGe
- Epitaxial
- SOI
- Si:C
- Composition
- thickness
- relaxation
- crystallography
- Nickel
- Ag
- Sn
- Silver
- LED manufacturing
- InP
- GaN
- AlGaN
- GaAs
- Omega-2Theta scans
- pHEMT
- Reciprocal Space Mapping
- RADS
- REFS
- 45nm
- 22nm
- 32nm
- 28nm
- JVXRR Hi-k and Metal Gate
- UBM
- CMP
- RDL
- Bumps
- Front End of Line
- FEOL
- Back End of Line
- BEOL
- X ray diffraction
- X ray fluorescence
- Bede x ray metrology
- X ray spectroscopy
- Semiconductor metrology
- Jordan Valley semiconductors
- x-ray reflectivity
- Wafer metrology
- Advanced metrology
- Semiconductor yield
- Semiconductor testing
- Metrosol
- Bede
- Jordan Valley Semi